The cover image may be different.

An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science

Paperback - 16 October 2015
Fearn, Sarah (Author)
Rp 746,000
No Hidden Cost

Or   1492 PEC Points
  
OTHER SERIES

New Free Shipping.
* Terms and Conditions
Quantity:
Delivered in 20 - 40 business days
BUY NOW

Description

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Product Details

ISBN-10: 1681740249

ISBN-13: 9781681740249

Publisher: Iop Concise Physics       

Language: English

Age Range: NA - NA years

Grade Level: NA - NA

Paperback: 66 Pages

Product Dimension (L x W x H): 25.40 x 17.78 x 0.46 CM

Shipping Weight: 0.18 Kg

Customer Reviews

Share your thoughts with other customers:
Write a Customer Review

There are no reviews for this product.

CONVENIENCE

BEST PRICE

SAFE/SECURITY

SERVICE

Books by the same author
 
Customers who bought this also bought
 

 

DELIVERY BY:
PAYMENT METHODS:
 
SECURED BY:
View Mobile / Standard © 2011-2020 Periplus Holdings Ltd.